Electron Microscopy /

Jeol JEM-1400 Transmission Electron Microscope

 
EMBI_Images_Jeol1400

Jeol JEM-1400
Transmission Electron Microscope
  Location: Room 1413
  Model:
   Jeol JEM-1400 (Jeol Ltd., Tokyo, Japan)
 
  • Resolution (Line), nm: 0.20
  • Resolution (Point), nm: 0.38
  • Filament: Tungsten
  • Voltage, kV: 40-120
  • Magnification: x50 - x800,000
 

Equipped with: Gatan Orius SC 1000B bottom mounted CCD-camera (Gatan Inc., USA)

  • Resolution: 4008 x 2672 pixels (9 µ each)
  • CCD active area: 36 x 24 mm
  • Scintilator: High-resolution phosphor
  • Binning: 1x, 2x, 3x, 4x
  • Dynamic range: 14-bit
  • Frame rate: 14 fps @ 4x binning full CCD area (1002 x 668 pixels) 30MHz dual port CCD readout
   
   

 

 

orius.pdf