Electron Microscopes
Jeol JEM-1400
Jeol JEM-1400
Transmission Electron Microscope
Location: Room 1413
Model: Jeol JEM-1400 (Jeol Ltd., Tokyo, Japan)
Resolution (Line), nm: 0.20
Resolution (Point), nm: 0.38
Filament: Tungsten
Voltage, kV: 40-120
Magnification: x50 - x800,000
Equipped with:
- Gatan Orius SC 1000B bottom mounted CCD-camera (Gatan Inc., USA)
- Resolution: 4008 x 2672 pixels (9 µ each)
- CCD active area: 36 x 24 mm
- Scintilator: High-resolution phosphor
- Binning: 1x, 2x, 3x, 4x
- Dynamic range: 14-bit
- Frame rate: 14 fps @ 4x binning full CCD area (1002 x 668 pixels) 30MHz dual port CCD readout
Hitachi HT7800
Hitachi HT780
Transmission Electron Microscope
Location: Room 1407
Electron gun: Tungsten
Accelerating voltage: 20-120
Resolution: 0.204
Maximum magnification: x600 000
Quanta FEG250 SEM
FEI Quanta 250 Field Emission Gun
Scanning Electron Microscope
Location: Room 1409
Vacuum modes:
- High vacuum
- Low vacuum
- Extended vacuum mode (ESEM) with cooling stage
Detectors:
- Everhardt Thornley SED (secondary electron detector)
- Large Field Low vacuum SED (LFD)
- Gaseous SED (GSED) (used in ESEM mode)
- vCD (low voltage high contrast detector)
- BSED (back scattered electron detector)
- Gatan BSED (used with 3View)
Equipped with the Gatan 3View system with the ability to obtain in situ 3D data at remarkably fine depth resolution by means of Serial Block-Face Scanning.
