Electron Microscopes

Jeol JEM-1400
Transmission Electron Microscope

Location: Room 1413

Model: Jeol JEM-1400 (Jeol Ltd., Tokyo, Japan)
Resolution (Line), nm: 0.20 
Resolution (Point), nm: 0.38 
Filament: Tungsten
Voltage, kV: 40-120
Magnification: x50 - x800,000

Equipped with:

• Gatan Orius SC 1000B bottom mounted CCD-camera (Gatan Inc., USA)
• Resolution: 4008 x 2672 pixels (9 µ each)
• CCD active area: 36 x 24 mm
• Scintilator: High-resolution phosphor
• Binning: 1x, 2x, 3x, 4x
• Dynamic range: 14-bit
• Frame rate: 14 fps @ 4x binning full CCD area (1002 x 668 pixels) 30MHz dual port CCD readout

Hitachi HT7800
Transmission Electron Microscope

Location: Room 1407

Electron gun: Tungsten
Accelerating voltage: 20-120
Resolution: 0.204
Maximum magnification: x600 000

Main imaging camera

• Model: Gatan Rio 9 (model 1809) bottom-mounted CMOS camera
• Image size: 3072 x 3072 pixels
• Pixel size: 9 um

FEI Quanta 250 Field Emission Gun
Scanning Electron Microscope

Location: Room 1409

Vacuum modes:

• High vacuum
• Low vacuum
• Extended vacuum mode (ESEM) with cooling stage

Detectors:

• Everhardt Thornley SED (secondary electron detector)
• Large Field Low vacuum SED (LFD)
• Gaseous SED (GSED) (used in ESEM mode)
• vCD (low voltage high contrast detector)
• BSED (back scattered electron detector)
• Gatan BSED (used with 3View)

Equipped with the Gatan 3View system with the ability to obtain in situ 3D data at remarkably fine depth resolution by means of Serial Block-Face Scanning.

Zeiss Crossbeam 550 Field Emission Gun
Scanning Electron Microscope equipped with Focus Ion Beam

Location: Room 1415

Zeiss Crossbeam 550 with GEMINI II electron optics is optimized for fast high-resolution low-kV imaging. The microscope is equipped with Gallium - Focused Ion Beam (FIB) for 3D EM imaging. It features a large chamber (330 mm inner diameter, 270 mm height) with 18 configurable ports for optional accessories, auto pendulum anti vibration system, 6-axes motorized super-eucentric stage, a plasma cleaner and charge compensation system.

Detectors:

• In-chamber, Everhardt Thornley SE detector
• In-chamber, retractable aBSD1 detector for backscattered electrons
• In-Lens detectors for SE electrons
• In-Lens EsB detector for backscattered electrons
• Two in-chambers cameras
• Navigation camera

Applications:

• High resolution standard SEM imaging using low accelatating voltages
• Imaging of large fields of view with an advanced stitching module
• Imaging of poorly conductive specimens with low voltages or with the help of the charge compensation system
• Isotropic and anisotropic 3D EM imaging with resolutions up to 4 x 4 x 4 nm and 2.5 x 2.5 x 5.0 nm

Zeiss Crossbeam 550 information