Electron Microscopes

Jeol JEM-1400
Transmission Electron Microscope

Location: Room 1413

Model: Jeol JEM-1400 (Jeol Ltd., Tokyo, Japan)
Resolution (Line), nm: 0.20 
Resolution (Point), nm: 0.38 
Filament: Tungsten
Voltage, kV: 40-120
Magnification: x50 - x800,000

Equipped with:

• Gatan Orius SC 1000B bottom mounted CCD-camera (Gatan Inc., USA)
• Resolution: 4008 x 2672 pixels (9 µ each)
• CCD active area: 36 x 24 mm
• Scintilator: High-resolution phosphor
• Binning: 1x, 2x, 3x, 4x
• Dynamic range: 14-bit
• Frame rate: 14 fps @ 4x binning full CCD area (1002 x 668 pixels) 30MHz dual port CCD readout

FEI Tecnai F20 Field Emission Gun 
Transmission Electron Microscope

Location: Room 1415

Model:
Tecnai F20 (Philips Electron Optics, Holland)
Resolution, nm: 
Lattice image: 0.14
Point to point: 0.24
Electron source: Field Emission
Voltage, kV: 200
Magnification: 

Equipped with:

• Gatan Ultrascan 4000 CCD-camera model 895 (4k x 4k) (Gatan Inc., USA)
• Gatan 622.SC camera (Gatan Inc., USA)
• Gatan 626 cryoholders (Gatan Inc., USA)
• Gatan CT3500 cryoholder (Gatan Inc., USA)
• Gatan 914 cryotomography holder (Gatan Inc., USA)
• Gatan dry pumping unit (Gatan Inc., USA)
• Fishione Model 2020 Advanced tomography holder (E.A. Fishione Instruments, USA)

Hitachi HT780
Transmission Electron Microscope

Location: Room 1407

Electron gun: Tungsten
Accelerating voltage: 20-120
Resolution: 0.204
Maximum magnification: x600 000

FEI Quanta 250 Field Emission Gun
Scanning Electron Microscope

Location: Room 1409

Vacuum modes:

• High vacuum
• Low vacuum
• Extended vacuum mode (ESEM) with cooling stage

Detectors:

• Everhardt Thornley SED (secondary electron detector)
• Large Field Low vacuum SED (LFD)
• Gaseous SED (GSED) (used in ESEM mode)
• vCD (low voltage high contrast detector)
• BSED (back scattered electron detector)
• Gatan BSED (used with 3View)

Equipped with the Gatan 3View system with the ability to obtain in situ 3D data at remarkably fine depth resolution by means of Serial Block-Face Scanning.